Application of a Global Minimization Technique for Depth Profile Inversion
El Fayome, E., Kamel, A., ElHennawy, H. (2016). Application of a Global Minimization Technique for Depth Profile Inversion. EKB Journal Management System, 10(10th International Conference on Electrical Engineering ICEENG 2016), 1-12. doi: 10.21608/iceeng.2016.30336
E. A. M. El Fayome; A. H. Kamel; H. S. ElHennawy. "Application of a Global Minimization Technique for Depth Profile Inversion". EKB Journal Management System, 10, 10th International Conference on Electrical Engineering ICEENG 2016, 2016, 1-12. doi: 10.21608/iceeng.2016.30336
El Fayome, E., Kamel, A., ElHennawy, H. (2016). 'Application of a Global Minimization Technique for Depth Profile Inversion', EKB Journal Management System, 10(10th International Conference on Electrical Engineering ICEENG 2016), pp. 1-12. doi: 10.21608/iceeng.2016.30336
El Fayome, E., Kamel, A., ElHennawy, H. Application of a Global Minimization Technique for Depth Profile Inversion. EKB Journal Management System, 2016; 10(10th International Conference on Electrical Engineering ICEENG 2016): 1-12. doi: 10.21608/iceeng.2016.30336

Application of a Global Minimization Technique for Depth Profile Inversion

The International Conference on Electrical Engineering
Article 41, Volume 10, 10th International Conference on Electrical Engineering ICEENG 2016, April 2016, Pages 1-12    PDF (227.35 K)
Document Type: Original Article
DOI: 10.21608/iceeng.2016.30336
Authors
E. A. M. El Fayome1; A. H. Kamel2; H. S. ElHennawy3
1Ministry of Interior.
2Advanced Industrial, Technical and Engineering Center.
3Electronics and Communications Department, Faculty of Engineering, Ain Shams University.
Abstract
Three simulated annealing cooling schedules (exponential, fast and Boltzmann) are designed, implemented and compared for performance on a depth profile inversion problem. The analysis of the performance results proves that the simulated annealing technique is able to solve nontrivial inverse problems.
Keywords
Global minimization; simulated annealing
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