Optical Characterization of Ge30-xSbxTe10Se60(0 ≤ x ≤ 20) Thin Films for Optoelectronics
(2023). Optical Characterization of Ge30-xSbxTe10Se60(0 ≤ x ≤ 20) Thin Films for Optoelectronics. EKB Journal Management System, 1(1), 75-109. doi: 10.21608/astb.2023.358645
. "Optical Characterization of Ge30-xSbxTe10Se60(0 ≤ x ≤ 20) Thin Films for Optoelectronics". EKB Journal Management System, 1, 1, 2023, 75-109. doi: 10.21608/astb.2023.358645
(2023). 'Optical Characterization of Ge30-xSbxTe10Se60(0 ≤ x ≤ 20) Thin Films for Optoelectronics', EKB Journal Management System, 1(1), pp. 75-109. doi: 10.21608/astb.2023.358645
Optical Characterization of Ge30-xSbxTe10Se60(0 ≤ x ≤ 20) Thin Films for Optoelectronics. EKB Journal Management System, 2023; 1(1): 75-109. doi: 10.21608/astb.2023.358645