Characterization of vanadium oxide thin films for optoelectronic application.
عبد الناصر القط نصر, . (2024). Characterization of vanadium oxide thin films for optoelectronic application.. EKB Journal Management System, 4(2), 13-26. doi: 10.21608/sjyr.2024.262806.1407
شيماء عبد الناصر عبد الناصر القط نصر. "Characterization of vanadium oxide thin films for optoelectronic application.". EKB Journal Management System, 4, 2, 2024, 13-26. doi: 10.21608/sjyr.2024.262806.1407
عبد الناصر القط نصر, . (2024). 'Characterization of vanadium oxide thin films for optoelectronic application.', EKB Journal Management System, 4(2), pp. 13-26. doi: 10.21608/sjyr.2024.262806.1407
عبد الناصر القط نصر, . Characterization of vanadium oxide thin films for optoelectronic application.. EKB Journal Management System, 2024; 4(2): 13-26. doi: 10.21608/sjyr.2024.262806.1407