EXHAUSTIVE ANALYSIS FOR DIFFERENT TYPES OF PARTIALLY ACCELERATED LIFE TESTS UNDER PROGRESSIVE CENSORING SCHEMES | ||
| HICMIS–Journal of Administrative Sciences and Digital Technology | ||
| Volume 2, Issue 3, September 2024 | ||
| Document Type: Original Article | ||
| DOI: 10.21608/hicmis.2025.332976.1003 | ||
| Author | ||
| Rashad M. EL-Sagheer* | ||
| High Institute for Computers and Information Systems, First Statement, New Cairo 11865, Cairo, Egypt. | ||
| Abstract | ||
| This paper offers a thorough examination of the partially accelerated life tests (PALT) within progressive censoring frameworks, with an emphasis on constant-stress, step-stress, and progressive-stress models. PALT methods play a vital role in assessing product reliability by exposing test units to different levels of stress to accelerate the occurrence of failures, all while keeping conditions relatable to actual usage. The constant-stress model uses a fixed stress level throughout the test duration, the step-stress model increases stress at specified times, and the progressive-stress model continuously varies the stress level. This research delves into the statistical approaches for modeling and estimating parameters within these stress frameworks and explores methods for managing progressively censored data. The findings provide valuable insights for enhancing test efficiency and improving predictions of product lifetime across various stress conditions, contributing to more accurate and reliable evaluations of product durability and performance in realistic environments. | ||
| Keywords | ||
| Partially accelerated life tests; Constant-stress; Step-stress; Progressive-stress; Censoring schemes | ||
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