ICMMS-2: Influence of Gamma Radiation on Nonlinear Optical, Semiconducting and Dielectrical Properties of In0.95Mn0.05Se Thin Films | ||||
Egyptian Journal of Chemistry | ||||
Article 2, Volume 64, Issue 3, March 2021, Page 1109-1115 PDF (800.44 K) | ||||
Document Type: Original Article | ||||
DOI: 10.21608/ejchem.2021.55843.3179 | ||||
View on SCiNiTO | ||||
Authors | ||||
Ahmed Abdel Moez1; Samia A. Gad2 | ||||
1Solid State Electronics Laboratory, Solid State Physics Department, Physics Research Division, National Research Centre, 33 El-Bohouth Street, Dokki, Giza 12622, Egypt. | ||||
2Semiconductor Laboratory, Solid State Physics Department, Physics Research Division, National Research Centre, 33 El-Bohouth Street, Dokki, Giza 12622, Egypt. | ||||
Abstract | ||||
In0.95Mn0.05Se films with of thickness 750 nm were evaporated by using thermal evaporation technique, this film was irradiated by γ radiation with doses (0,40 and 120 KGy). Both of dispersion energy (Ed) and oscillating energy (Eo) were determined. The values of lattice dielectric constant (εL) and free carrier concentration/effective mass) (N/m*) were calculated. On the other hand, the values of first order of moment (M-1), the third order of moment (M-3) and static refractive index (no), were determined. Both of dielectric loss (ε\) and dielectric tangent loss (ε\\) for these films increased with photon energy (hν). Also, the same behavior was noticed for the real part of optical conductivity (σ1) and imaginary part of optical conductivity (σ2). The Linear optical susceptibility (χ(1)) increases with (hν)for all compositions. The nonlinear optical parameters such as, nonlinear refractive index (n2), the third-order nonlinear optical susceptibility (χ(3)), non-linear absorption coefficient (βc) , were determined theoretically. Both of the electrical susceptibility (χe) and relative permittivity (εr) increase with photon energy and had a highest value near the energy gap. The semiconducting results such as, density of the valence band, conduction band and Fermi level position (Ef) were calculated. | ||||
Keywords | ||||
In1-xMnxSe thin films; γ radiation; Dielectrical results; Semiconducting results; non- linear optical properties | ||||
Statistics Article View: 385 PDF Download: 379 |
||||