Annealing Effects on the Structural and Optical Parameters of Cu3In17Se80 Thin Films
(2010). Annealing Effects on the Structural and Optical Parameters of Cu3In17Se80 Thin Films. EKB Journal Management System, 33(1), 29-45. doi: 10.21608/ejs.2010.148678
. "Annealing Effects on the Structural and Optical Parameters of Cu3In17Se80 Thin Films". EKB Journal Management System, 33, 1, 2010, 29-45. doi: 10.21608/ejs.2010.148678
(2010). 'Annealing Effects on the Structural and Optical Parameters of Cu3In17Se80 Thin Films', EKB Journal Management System, 33(1), pp. 29-45. doi: 10.21608/ejs.2010.148678
Annealing Effects on the Structural and Optical Parameters of Cu3In17Se80 Thin Films. EKB Journal Management System, 2010; 33(1): 29-45. doi: 10.21608/ejs.2010.148678

Annealing Effects on the Structural and Optical Parameters of Cu3In17Se80 Thin Films

Egyptian Journal of Solids
Article 3, Volume 33, Issue 1, December 2010, Page 29-45  XML PDF (397.03 K)
Document Type: Original Article
DOI: 10.21608/ejs.2010.148678
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Abstract
Cu3In17Se80 thin films were prepared by thermal evaporation technique on glass and quartz substrates. X-ray diffraction analysis for the as-deposited and annealed thin films at 423K and 473 K showed that they have amorphous structure nature. The optical constants (refractive index n and absorption index k) of the as-deposited and annealed films for several samples of different thickness (from 11 nm to 61.4 nm) have been calculated from optical transmittance and reflectance data in the wavelength range 400-2500 nm. Analysis of the refractive index, n, yields high frequency dielectric constant of 8.24 for the as-deposited films which increases with annealing. The optical transitions from absorption coefficient (α) analysis are found to be allowed indirect for the as-deposited and annealed films, and the corresponding energy gap is 1.1 eV for the as-deposited films, which increases with increasing annealing temperature.
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