Characterization of Nanostructural ZnSe Prepared by Inert Gas Condensation Method | ||||
| Egyptian Journal of Solids | ||||
| Article 6, Volume 27, Issue 2, 2004, Page 223-232 PDF (110.21 K) | ||||
| DOI: 10.21608/ejs.2004.149847 | ||||
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| Abstract | ||||
| Polycrystalline powder of nanostructural ZnSe was successfully prepared by Inert Gas Condensation (IGC) method. The Energy Dispersion Analysis of X-ray (EDAX) showed that the ZnSe films have the atomic ratio of Zn:Se = 1:1.25. The structure characteristics of the prepared samples were investigated by X-Ray Diffraction (XRD) technique. Materials deposited at temperatures less than -30 oC show amorphous structure. Also, the asdeposited (-30 oC) and annealed (80 oC, 60 min) films of 110 nm thick have not ensured their crystallinity. However, the results of the collected powder that scraped from the films confirmed the presence of crystalline nanostructural ZnSe of cubic zinc blende structure with lattice parameter a0 = 0.5670 nm. The grain size and size distribution of the powder sample was determined by line profile analysis using WinFit computer program and Fourier analysis. It was found that crystallite size is ≈ 3.6 nm. The size distribution characterized by being asymmetrical unimodeal and skewed towards small size with maximum fraction at crystallite size of ≈ 1.2 nm. On the other hand, the cumulative size distribution shows that 50% volume fraction exhibits crystallites finer than 2.3nm. | ||||
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