Dielectric Relaxation in AL- Substituted Ni – Cd Spinel Ferrites | ||||
| Egyptian Journal of Solids | ||||
| Article 12, Volume 27, Issue 2, 2004, Page 285-297 PDF (336.19 K) | ||||
| DOI: 10.21608/ejs.2004.149853 | ||||
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| Abstract | ||||
| The real part of dielectric constant (ε΄) and dielectric loss tangent (tanδ) were studied for Al.- substituted Ni – Cd spinel ferrites having the chemical formula Ni0.7 Cd0.3 Fe2-x Alx O4 where [x= 0.4, 0.6, 0.8,and 1] This is carried our in the range of temperature from room temperature up to 650 K and applying frequencies from 102 to 105 Hz. The distribution of Al ions in the B and A sites has changed with changing x and was found to affect the dielectric constant ε ΄ of the samples which have relatively high values. The frequency dependence of the dielectric constant was found to exhibit two different behaviors related to temperature values and indicating the presence of two types of charge carriers at high temperatures. The frequency dependence of tanδ shows the existence of broad peaks at low temperature range, which indicates that there is a distribution of relaxation times rather than a single relaxation time. | ||||
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