Analysis of the Maximum and the Minimum of the Spectral Transmittance According to the Coherence Condition for Weakly Absorbing Thin Films | ||||
Egyptian Journal of Solids | ||||
Article 8, Volume 23, Issue 1, 2000, Page 81-91 PDF (105.46 K) | ||||
DOI: 10.21608/ejs.2000.151478 | ||||
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Abstract | ||||
In this work the maximum max Tsam and the minimum min Tsam of the spectral transmittance of weakly absorbing thin films deposited on non-absorbing substrate is analyzed as a function of refractive indices of both substrate and film according to the coherence condition. Also the ratio of Tsam. /Tw (where Tw is the transmittance of the uncoated substrate) is obtained for both homogeneous and inhomogeneous films. The results of the analysis enabled us to interpret the increment of the ratio (Tsam. / Tw) over unity, distinguishing the inhomogeneous and homogenous films and obtaining the refractive index of the film. | ||||
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