Functional Groups, Band Gap Energy, and Morphology Properties of Annealed Silicon Dioxide (SiO2)
Wardani, D., Hariyanto, B., Kurniawati, N., Har, N., Darmawan, N., Irzaman, I. (2023). Functional Groups, Band Gap Energy, and Morphology Properties of Annealed Silicon Dioxide (SiO2). EKB Journal Management System, 66(3), 529-535. doi: 10.21608/ejchem.2022.107057.5148
Dyah Ayu Pramoda Wardani; Budi Hariyanto; Neny Kurniawati; Nazopatul Patonah Har; Noviyan Darmawan; Irzaman Irzaman. "Functional Groups, Band Gap Energy, and Morphology Properties of Annealed Silicon Dioxide (SiO2)". EKB Journal Management System, 66, 3, 2023, 529-535. doi: 10.21608/ejchem.2022.107057.5148
Wardani, D., Hariyanto, B., Kurniawati, N., Har, N., Darmawan, N., Irzaman, I. (2023). 'Functional Groups, Band Gap Energy, and Morphology Properties of Annealed Silicon Dioxide (SiO2)', EKB Journal Management System, 66(3), pp. 529-535. doi: 10.21608/ejchem.2022.107057.5148
Wardani, D., Hariyanto, B., Kurniawati, N., Har, N., Darmawan, N., Irzaman, I. Functional Groups, Band Gap Energy, and Morphology Properties of Annealed Silicon Dioxide (SiO2). EKB Journal Management System, 2023; 66(3): 529-535. doi: 10.21608/ejchem.2022.107057.5148

Functional Groups, Band Gap Energy, and Morphology Properties of Annealed Silicon Dioxide (SiO2)

Egyptian Journal of Chemistry
Volume 66, Issue 3, March 2023, Page 529-535  XML PDF (804.82 K)
Document Type: Original Article
DOI: 10.21608/ejchem.2022.107057.5148
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Authors
Dyah Ayu Pramoda Wardani email orcid 1; Budi Hariyanto2; Neny Kurniawati2; Nazopatul Patonah Har3; Noviyan Darmawanorcid 4; Irzaman Irzamanorcid 3
1Department of Chemistry, Faculty of Mathematics and Natural Science, University of Palangka Raya, Palangka Raya, Kalimantan Tengah, 73111, Indonesia
2Department of Physics, Faculty of Mathematics and Natural Science, Universitas Palangka Raya, Palangka Raya 73111, Indonesia
3Department of Physics, Faculty of Mathematics and Natural Sciences, IPB University, Bogor, Indonesia
4Department of Chemistry, Faculty of Mathematics and Natural Sciences, IPB University, Bogor 16680, Indonesia
Abstract
Annealed silicon dioxide (SiO2) has been prepared by various annealing temperatures at 0 (without treatment, room temperature), 800 °C, 900 °C and 1000 °C denote as S0, S800, S900 and S1000. The properties of the annealed SiO2 were characterized by three methods. The functional groups were identified using FTIR, the band gap energy was determined using UV-Vis DR, and the morphological properties of SiO2 were determined using SEM. FTIR data show that the characteristic functional groups of annealed silicon dioxide are Si-O-Si, Si-Si, -OH, H-Si-Si-H (monohydride), dan Si-OH. The band gap energy values for annealed SiO2 at S0, S800, S900 and S1000 were 2.27; 2.27; 2.26; 2.22 eV. The morphology of silicon dioxide shows that silicon dioxide has irregular shape and size, it has sharp angles accompanied by small flakes on the surface, the particle size is estimated to be around 3-10 μm.
Keywords: annealed silicon dioxide (SiO2); functional group; band gap energy; morphology.
Keywords
annealed silicon dioxide (SiO2); functional group; band gap energy; morphology
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