Cumulative Sum Control Chart for a Doubly Truncated Binomial Distribution | ||||
| The Egyptian Statistical Journal | ||||
| Article 9, Volume 35, Issue 1, June 1991, Page 119-124 | ||||
| Document Type: Original Article | ||||
| DOI: 10.21608/esju.1991.315000 | ||||
 View on SCiNiTO | ||||
| Authors | ||||
| Ashit Baran Chakraborty; Samir K. Bhattacharya | ||||
| Abstract | ||||
| The CUSUM control chart for a doubly truncated binomial distribution (DTBD) is developed by using the well known approach of Johnson and the parameters of the V-mask are computed. The average run length for the one sided CUSUM scheme for testing the proportion of defectives underlying the DTBD is also obtained and the effect of truncation on this characteristic is investigated | ||||
| Keywords | ||||
| Average Run Length; Cumulative Sum Control Chart; Doubly Truncated Binomial Distribution; Truncation Effect; V-mask Parameters | ||||
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Statistics Article View: 18 |
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