Compact model for undoped symmetric double gate comprising quantization effect | ||||
The International Conference on Electrical Engineering | ||||
Article 74, Volume 6, 6th International Conference on Electrical Engineering ICEENG 2008, May 2008, Page 1-10 PDF (102.59 K) | ||||
Document Type: Original Article | ||||
DOI: 10.21608/iceeng.2008.34314 | ||||
View on SCiNiTO | ||||
Authors | ||||
Ahmed Abo-Elhadeed1; Tarek Abdolkader2; Wael Fikry3; Hani Ragaie4 | ||||
1Mentor Graphics. | ||||
2Higher Institute of Technology, Benha University. | ||||
3Ain Shams University. | ||||
4French University in Egypt. | ||||
Abstract | ||||
Abstract: In this paper we propose an analytical modification for Hu’s model which is an analytical model for undoped symmetric double gate MOSFETs. This modification targets to include the energy states quantization effect on the drain current. This leads to correct the model behavior for ultra thin double gate. Moreover, we introduce a simple method to include the velocity saturation effect in the current equation. Comparison with device simulator results is finally presented to validate the proposed modifications. | ||||
Keywords | ||||
double gate MOSFETS; compact models; quantization effect; velocity saturation | ||||
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