A NOVEL SYSTEM FOR PHOTOVOLTAIC SOLAR CELL TEST AND CHARACTERISTIC MEASUREMENTS | ||||
| ERJ. Engineering Research Journal | ||||
| Article 4, Volume 32, Issue 4, October 2009, Page 429-435 PDF (820.29 K) | ||||
| Document Type: Original Article | ||||
| DOI: 10.21608/erjm.2009.69522 | ||||
 View on SCiNiTO | ||||
| Authors | ||||
| Yousry Atia; Mohamed Zahran | ||||
| Electronics Research Institute, PV Cells Dept, El-Tahrir St., Dokki, 12311-Giza, Egypt | ||||
| Abstract | ||||
| This paper describes a proposed system for testing and characteristics measurement of photovoltaic (PV) solar cells, module andlor array. The measurements are made using data acquisition system designed and implemented in the laboratory to facilitate the measuring and monitoring of the PV cells characteristics. The functioning of the software is based on the socalled virtual instrumentation. This is a non-conventional data acquisition system. The proposed system can be implemented at significantly lower cost than the commercial one. The dark characteristics test facility, based on LabVIEW software to design an easy handling Graphical User Interface (GUI) and use a single chip microcontroller with a serial interface as a data logger. The system is used to acquire the measured data from the cell under test and transfer it to a supervisory computer for monitoring and other signal processing. The system also allows the user to save the collected data for documentation. The preliminary test we have made indicates that the system proposed here is highly reliable, which allows measuring and monitoring variety of solar cell, module andlor array characteristics with a good accuracy. So it can be used in trusted manner for evaluating and documenting the PV systems. | ||||
| Keywords | ||||
| solar cells; Photovoltaic; PV characteristics measurement; I-V Curve Tracer; LabVIEW; PC-Microcontroller interfacing | ||||
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