Relations for moments of k-th record values from exponential-Weibull lifetime distribution and a characterization | ||||
| Journal of the Egyptian Mathematical Society | ||||
| Volume 23, Issue 3, 2015, Page 558-562 PDF (431.44 K) | ||||
| Document Type: Original Article | ||||
| DOI: 10.1016/j.joems.2014.11.003 | ||||
 View on SCiNiTO | ||||
| Authors | ||||
| R.U. Khan* ; A. Kulshrestha; M.A. Khan | ||||
| Department of Statistics and Operations Research, Aligarh Muslim University, Aligarh 202 002, India | ||||
| Abstract | ||||
| In this note we give some recurrence relations satisfied by single and product moments of k-th upper record values from the exponential-Weibull lifetime distribution. Using a recurrence relation for single moments we obtain a characterization of exponential-Weibull, Weibull, exponential, Rayleigh and two parameter linear failure rate distributions. | ||||
| Keywords | ||||
| KEYWORDS Order statistics; k-th upper record values; Exponential-Weibull distribution; Single moments; Product moments; Recurrence relations and characterization | ||||
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