EKB Journal Management System
Keywords = Built-In Self-Test (BIST)
Number of Articles: 1

1

Design for Testability Technique for Microcontroller

Volume 8, 8th International Conference on Electrical Engineering ICEENG 2012, May 2012, Page 1-18
Sherif I. Morsy; Mohamed H. El-Mahlawy; Gouda I. Mohamed