A NEW SINGLE TEST PATTERN GENERATOR FOR PSEUDOEXHAUSTIVE TESTING | ||||
| International Conference on Aerospace Sciences and Aviation Technology | ||||
| Article 62, Volume 11, ASAT Conference, 17-19 May 2005, May 2011, Page 989-1002 PDF (3.18 MB) | ||||
| Document Type: Original Article | ||||
| DOI: 10.21608/asat.2011.27211 | ||||
 View on SCiNiTO | ||||
| Authors | ||||
| Mohamed H. EI-Mahlawy1; Winston Waller2 | ||||
| 1Egyptian Armed Forces. | ||||
| 2Senior Lecturer, VLSI group, Kent University at Canterbury. | ||||
| Abstract | ||||
| In this paper, we present a novel test pattern generator for pseudoexhaustive testing. This generator bridges the gap between convolved LFSR/SR and permuted LFSR/SR. It is considered to be the optimal pseudoexhaustive test pattern generator as far as the lengths of test set and hardware overhead are concerning. We present an efficient search to assign the residues for the inputs of the CUT to increase the chance to get several solutions and reduce the hardware overhead. With small number of permutations in the assigned residues, the chance of obtaining efficient results may be increased. The novel generator is considered the general form of the pseudoexhaustive test pattern generator. The simple LFSR/ SR, the permuted LFSR/SR, and convolved LFSR/SR are considered the special case of the novel generator. The experimental results indicate the superiority of this generator and the efficiency of our approach. | ||||
| Keywords | ||||
| Design for testability of VLSI design; pseudoexhaustive testing | ||||
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