Keywords = Design for testability of VLSI design
| Number of Articles: 1 | ||
| 1 | A NEW SINGLE TEST PATTERN GENERATOR FOR PSEUDOEXHAUSTIVE TESTING | |
| Volume 11, ASAT Conference, 17-19 May 2005, May 2011, Page 989-1002 | ||
| Mohamed H. EI-Mahlawy; Winston Waller | ||
| Number of Articles: 1 | ||
| 1 | A NEW SINGLE TEST PATTERN GENERATOR FOR PSEUDOEXHAUSTIVE TESTING | |
| Volume 11, ASAT Conference, 17-19 May 2005, May 2011, Page 989-1002 | ||
| Mohamed H. EI-Mahlawy; Winston Waller | ||
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